Spectroscopic studies and AFM analysis of Ho3+ and Tm 3+ doped yttrium oxide nanoparticles

Darayas Patel, Christopher Perry, Sarah Kennedy

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationOptical Components and Materials IV
DOIs
StatePublished - 2007
EventOptical Components and Materials IV - San Jose, CA, United States
Duration: Jan 22 2007Jan 24 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6469
ISSN (Print)0277-786X

Conference

ConferenceOptical Components and Materials IV
Country/TerritoryUnited States
CitySan Jose, CA
Period1/22/071/24/07

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Keywords

  • Atomic force microscope
  • Nanocrystals
  • Rare-earth
  • Scanning electron microscope
  • Upconversion

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