@inproceedings{f43b5618fd6a4edfa83ed7bd0919dc22,
title = "Chemical etching of nanocomposite metal-semiconductor films monitored by Raman spectroscopy and surface probe microscopy",
keywords = "Atomic Force Microscopy (AFM), Nanocomposite metal-semiconductor films, Nanostructures, Nanotechnology, Raman spectroscopy, Silicon surface",
author = "Perry, {Christopher C.} and Tina Brower and Chichang Zhang and Emanuel Waddell and Bates, {Clayton W.} and Mitchell, {James W.}",
year = "2008",
doi = "10.1117/12.783857",
language = "English",
isbn = "9780819470669",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Organic Photonic Materials and Devices X",
note = "Organic Photonic Materials and Devices X ; Conference date: 22-01-2008 Through 24-01-2008",
}